Backlight illumination measurement – optical profile projector principle
Normally, the system is used for 2D tasks, while 3D systems can also be used simultaneously.
Measurement can take place in rotation, linear motion, or static position of the object.
Typically, this method is used to measure and control rotational products, wear tools, check the correct shape, etc.
Measurement accuracy is up to ± 1 μm.
Selected solutions for this method:
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